The 25th (2025) Yamazaki-Teiichi Prize Winner Measurement Science and Technology
Developments and Applications of X-ray phase imaging
| Winner | |||
|---|---|---|---|
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Atsushi Momose Institute of Multidisciplinary Research for Advanced Materials, Tohoku University / Professor | ||
Reason for award
Dr. Momose focused on the phase contrast of materials that weakly absorbed X-rays and pioneered "X-ray phase imaging." Using digital image measurement techniques, he established a technology that is able to quantitatively measure X-ray phase shifts under the influence of absorption contrast, achieving revolutionary high sensitivity in X-ray imaging. He has also acquired intellectual property rights, both domestically and internationally, for his invention of "X-ray phase imaging" - an X-ray optical system utilizing the Talbot interferometer that does not require a synchrotron radiation facility. Further integration with X-ray CT technique has also allowed him to devise and realize the world's very first X-ray phase CT capable of visualizing the three-dimensional distribution of refractive index from interferograms.
In the applications of "X-ray phase imaging" to industrial nondestructive testing, Dr. Momose has carried out joint research with domestic and international corporations in the form of X-ray phase scanners and X-ray phase CT systems, which has in turn led to the commercialization of X-ray phase CT systems and other products through licensing agreements with several corporations. A further application of "X-ray phase imaging" in medical diagnostic imaging includes his collaboration with medical device manufacturers to develop a system that can be readily installed in hospitals for the early diagnosis of rheumatoid arthritis based on its visualization capabilities of cartilage. He is conducting clinical research at several university hospitals to advance research and development aimed at overcoming challenges such as radiation dose, and further developments are expected in the near future.
Dr. Momose is therefore selected as the recipient of the 25th Yamazaki-Teiichi Prize in the field of Measurement Science and Technology for the aforementioned reasons.